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Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode

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Fabero Jiménez, Juan Carlos and Mecha López, Hortensia and Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Korkian, Golnaz and Rey, Solenne and Cheymol, Benjamin and Baylac, Maud and Hubert, Guillaume and Velazco, Raoul (2020) Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode. IEEE Transactions on Nuclear Science . ISSN 0018-9499 (In Press)

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Official URL: https://ieeexplore.ieee.org/document/9020124




Abstract

A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, BRAM, or flip-flops. SBUs and MCUs with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUSCA SEP3 was used to make assesment for actual environments and an improvement of SEU injection test is proposed.


Item Type:Article
Uncontrolled Keywords:FPGA, neutron tests, radiation hardness, reliability, soft error.
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
Sciences > Computer science > Electronics
Sciences > Computer science > Electronics
ID Code:59496
Deposited On:16 Mar 2020 19:14
Last Modified:17 Mar 2020 08:05

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