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Study of pinholes and nanotubes in AlInGaN films by cathodoluminescence and atomic force microscopy



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Herrera, M. and Cremades Rodríguez, Ana Isabel and Piqueras de Noriega, Javier and Stutzmann, M. and Ambacher, O. (2004) Study of pinholes and nanotubes in AlInGaN films by cathodoluminescence and atomic force microscopy. Journal of Applied Physics , 19 (11). pp. 1236-1239. ISSN 0021-8979

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Official URL: http://jap.aip.org/japiau/v95/i10/p5305_s1


Cathodoluminescence (CL) in the scanning electron microscope and atomic force microscopy (AFM) have been used to study the formation of pinholes in tensile and compressively strained AlInGaN films grown on Al2O3 substrates by plasma-induced molecular beam epitaxy. Nanotubes, pits, and V-shaped pinholes are observed in a tensile strained sample. CL images show an enhanced emission around the pits and a lower intensity at the V-shaped pinholes. Rounded pinholes appear in compressively strained samples in island-like regions with higher In concentration. The grain structure near the pinholes is resolved by AFM. (C) 2004 American Institute of Physics.

Item Type:Article
Additional Information:

© 2004 American Institute of Physics.
This work has been partially support by the MCYT
(Project No. MAT-2000-2119). M. H. thanks CONACYT for a postdoctoral grant. The help of Dr. Hidalgo in the experimental measurements is acknowledged.

Uncontrolled Keywords:Multiple-Quantum Wells, Formation Mechanism, Structural Defects, Band-Gap, Heterostructures, Luminescence, Growth, Alloys, Dislocations, Strain
Subjects:Sciences > Physics > Materials
ID Code:23247
Deposited On:21 Oct 2013 15:41
Last Modified:13 Feb 2018 15:34

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