Cathodoluminescence and REBIC study of defects in tin oxide



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Maestre Varea, David and Cremades Rodríguez, Ana Isabel and Piqueras de Noriega, Javier (2004) Cathodoluminescence and REBIC study of defects in tin oxide. In 24th International Conference on Microelectronics (MIEL 2004). Proceedings (International Conference on Microelectronics), 2 . IEEE, pp. 433-436. ISBN 0-7803-8166-1

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Cathodoluminescence (CL) and remote electron beam induced current (REBIC) in the scanning electron microscope (SEM) has been used to investigate the electron recombination mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analysed by CL microscopy and spectroscopy. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 eV and 2.58 eV emissions which is explained by formation and recovery of defects during milling. REBIC measurements and imaging are used to characterize the formation of a potential barrier at the grain boundaries.

Item Type:Book Section
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© 2004 American Institute of Physics.
International Conference on Microelectronics (24. 2004.Nis, Servia).
This work has been supported by MCYT (Project No. MAT 2000-2119). D. M. acknowledges a grant from MCYT.

Uncontrolled Keywords:Grain-Boundaries, Surface
Subjects:Sciences > Physics > Materials
ID Code:23262
Deposited On:18 Oct 2013 18:18
Last Modified:02 Sep 2020 10:59

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