Composition-dependent electronic properties of indium-zinc-oxide elongated microstructures

Abstract

Microrods and hierarchical structures of indium-zinc-oxide (IZO) with different compositions were grown by thermal treatments of mixtures of InN and ZnO powders. In long rods, an increase in Zn content along the growth axis is revealed by energy dispersive spectroscopy. The structures obtained range from Zn-doped indium oxide with a few atomic per cent of Zn, to IZO compounds of the type Zn_kIn_2O_k+3. X-ray photoelectron spectroscopy measurements with spatial resolution show that IZO microstructures degenerate at room temperature, with carrier concentration of the order of 10^20 cm^-3. Electron accumulation has been found for undoped (1 0 0) and (1 1 1) surfaces, whereas depletion of carriers at the surface is observed in IZO samples. The Fermi level position correlates with the Zn concentration at the surface which, taking into account the surface dependence of the ionization potentials, work functions and band gaps, could lead to tunable material properties for device applications. Cathodoluminescence emission intensity is enhanced by the presence of Zn, which induces spectral changes and broadening of the emission band compared with undoped material. The results are discussed in terms of the charge neutrality level and the band structure of the material.