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Miranda Pantoja, José Miguel and Muñoz San Martín, Sagrario and Sebastián Franco, José Luis (2001) Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques. In IEEE Instrumentation and Measurement Technology Conference. IEEE, Budapest, Hungary, pp. 530-533. ISBN 0-7803-6646-8
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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=928875
Abstract
This paper presents a procedure for an accurate characterization of parasitic effects of terminal pads in microwave devices. This procedure is based on the measurement of S and Noise parameters of the device with two different sets of calibration standards, and simplifies the process of extracting the parasitic elements of the small signal equivalent circuit.
| Item Type: | Book Section |
|---|---|
| Additional Information: | © IEEE. IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) (18.2001.Budapest, Hungria). |
| Uncontrolled Keywords: | Signal. |
| Subjects: | Sciences > Physics > Electricity Sciences > Physics > Electronics |
| ID Code: | 24670 |
| Deposited On: | 17 Mar 2014 11:33 |
| Last Modified: | 02 Sep 2020 10:18 |
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