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Cathodoluminescence characterization of InGaSb crystals

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Chioncel, M.F. and Díaz-Guerra Viejo, Carlos and Piqueras de Noriega, Javier and Vincent López, José Luis and Bermudez, V. and Dieguez, E. (2004) Cathodoluminescence characterization of InGaSb crystals. In 2004 24th International Conference on Microelectronics, Proceedings, Vols 1 and 2. Proceedings (International Conference on Microelectronics.) . IEEE. ISBN 0-7803-8166-1

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Official URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1314870&tag=1




Abstract

The nature and the spatial distribution of radiative defects in In(X)Ga(1-x)Sb grown by the vertical Bridgman method have been studied by cathodoluminescence (CL) in a scanning electron microscope. The CL results have been complemented by X-ray microanalysis and backscattered electron imaging to relate the local luminescence properties to the chemical composition. Measurements of the band gap energy from the CL spectra, supported by X-ray compositional mappings, reveal an effective incorporation of In in the matrix, leading to the fori-nation of the ternary alloy in the whole volume of the ingot. A band often observed in the CL spectra, peaked at about 20 meV below the band gap energy, is attributed to the presence in the ternary alloy of an acceptor level that would correspond to the V(Ga)-Ga(Sb) acceptor in GaSb.


Item Type:Book Section
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©(2004) IEEE.
International Conference on Microelectronics (MIEL 2004).(24. 2004. Nis, Serbia).
This work has been carried out in the frame of the Fifth Framework European Programme for research, HPRN-CT 2001-00199 project. M.F.C. acknowledges European Commission for financial support. Support from MCYT through project MAT2000-2119 is also

Uncontrolled Keywords:Gallium Antimonide, Gasb, Photoluminescence, Growth, Insb
Subjects:Sciences > Physics > Materials
ID Code:26320
Deposited On:21 Jul 2014 08:09
Last Modified:02 Sep 2020 10:55

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