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Díaz-Guerra Viejo, Carlos and Piqueras de Noriega, Javier (1997) Remote electron beam induced current imaging of electrically active regions in YBa_2Cu-3O_(7-x) single crystals. Applied Physics Letters, 71 (19). pp. 2830-2832. ISSN 0003-6951
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Official URL: http://dx.doi.org/10.1063/1.120419
Abstract
Remote electron beam induced current (REBIC) measurements have been carried out to investigate electrically active regions in YBa_2Cu_3O_(7-x) single crystals. Enhanced REBIC contrast, found in growth steps and other topographic features of the samples, is discussed in terms of charged oxygen-related defects. The capability of REBIC to image structural inhomogeneities caused by strain or plastic deformation in these crystals is also established. Charge carrier diffusion length has been estimated at different temperatures from REBIC linescan profiles.
| Item Type: | Article |
|---|---|
| Additional Information: | © 1997 American Institute of Physics. |
| Uncontrolled Keywords: | Superconducting Thin-Films, Cathodoluminescence Microscopy, Grain-Boundaries |
| Subjects: | Sciences > Physics > Materials |
| ID Code: | 26389 |
| Deposited On: | 30 Jul 2014 11:22 |
| Last Modified: | 30 Jul 2014 11:24 |
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