Study of point defects in CdTe and CdTe:V by cathodoluminescence



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Pal, U. and Piqueras de Noriega, Javier and Fernández Sánchez, Paloma and Serrano, M. D. and Diéguez, E. (1994) Study of point defects in CdTe and CdTe:V by cathodoluminescence. Journal of Applied Physics, 76 (6). pp. 3720-3723. ISSN 0021-8979

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Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands.

Item Type:Article
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© 1994 American Institute of Physics.
U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017).

Uncontrolled Keywords:Physics, Applied
Subjects:Sciences > Physics > Materials
ID Code:26974
Deposited On:03 Oct 2014 08:45
Last Modified:03 Oct 2014 08:45

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