Publication: Study of point defects in CdTe and CdTe:V by cathodoluminescence
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1994-09-15
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American Institute of Physics
Abstract
Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands.
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© 1994 American Institute of Physics.
U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017).
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