Publication: Scanning electron‐acoustic microscopy of MgO crystals
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1989-04-01
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American Institute of Physics
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Abstract
The capability of scanning electron‐acoustic microscopy in the characterization of MgO crystals has been studied. The conditions for the observation of different surface and subsurface features in as‐grown and deformed crystals are described and the results are discussed on the basis of thermal and nonthermal mechanisms of acoustic signalgeneration.
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© American Institute of Physics.
This work has been supported by the Wolkswagen Foundation and by the Comision Interministerial de Ciencia y Tecnología (Project PB86-0151). The assistance of the Departament of Materials for Electrical and Electronic Engineering of the University of Duisburg (G.F.R.)has made possible the development of the SEAN technique in our laboratory. Special thanks are due to Professor E. Kubalek and Dipl. Phys, N. Kultscher. The help of P. Fernández in this work is acknoawledged.
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1. E. Brandis and A. Rosencwaig Appl. Phys. Lett. 37, 98 (1980).
2. G. S. Cargill, Nature 286, 691 (1980).
3. A. Rosencwaing, Annu. Rev. Mater. Sic. 15,1.3 (1985).
4. L. J. Balk, Can. J. Phys. 64, 1238 (1986).
5. D. G. Davis, Philos. Trans. R. Soc. London Ser. A. 320, 243 (1986).
6. D. G. Davis, Scanning Electron Microsc. III 1163 (1983).
7. J. Llopis , J. Piqueras, and L. Brú, J. Mater Sci 1361 (1978).
8. J. Piqueras, J. Llopis, and L. Delgado, J. ppl Phys. 52,4341 (1981).
9. C. Caballeros, J. Llopis, and Appl. Phys. 5453, 3201(1982).
10. J. Llopis and J. Piqueras, J. Appl. Phys. 54, 4570 (1983).
11. L. J. Balk and N. Kultscher, Ins. Phys. Conf. Ser. 67,387 (1983).
12. J. Llopis and J. Piqueras , Phys Status Solidi A 49, K9 (1978).
13. J. Opsal and A. Rosencwaig, J. Appl. Phys. 53, 4240 (1982).
14. N. Kultscher and L. J. Balk, Scannig Electron Microsc. I, 33 (1986).
15. L. J. Balk, D. G. Davies, and N. Kultscher, Phys. Status Solidi A. 82, 23 (1984).
16. J. C. Murphy, J. Maclachlan, and L.C. Aamodt, IEEE Trans. Ultrason. Ferroelectri. Frec. Control. UFFC-33, 529 (1986).
17. A. Remón, J. Piqueras, J. Llopis, and C. Ballesteros, Phys. Status solidi A 77, K29 (1983).
18. W. L. Holstein, J. Electron Microsc. Tech. 5,91 (1987).
19. T. Ikoma, M. Murayama, and K. Morizuza, Jpn. J. Appl. Phys 23, Suppl. 23-1, 194 (1983).
20 L. J., D. G. Davies, and N. Kultscher, Scanning Electron Microsc. III, 1601 (1984).