Modification of the LM124 single event transients by load resistors



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Franco Peláez, Francisco Javier and López Calle, Isabel and González Izquierdo, Jesús and Agapito Serrano, Juan Andrés (2010) Modification of the LM124 single event transients by load resistors. IEEE transactions on nuclear science, 57 (1). pp. 358-365. ISSN 0018-9499

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The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.

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(c) 2010 IEEE. Personal use of this material is ermitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

Uncontrolled Keywords:SPICE; Operational amplifiers; Resistors; LM124 Operational amplifier; SPICE Simulation; Distortion; Feedback network; Laser test; Load effect; Load resistor; Single event transients; Absorption; Critical current; Laser noise; Operational amplifiers; Optical pulse generation; Pulse amplifiers; Resistors; SPICE; Shape; Testing; LM124; Laser irradiation; Load effects; Operational amplifier; Single event transients; Two-photon absorption
Subjects:Sciences > Physics > Electronics
Sciences > Computer science > Integrated circuits
ID Code:28855
Deposited On:27 Feb 2015 11:32
Last Modified:10 Dec 2018 14:58

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