Evidence of the robustness of a COTS soft-error free SRAM to neutron radiation



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Velazco, Raoul and Clemente Barreira, Juan Antonio and Hubert, Guillaume and Mansour, Wassim and Palomar Trives, Carlos and Franco Peláez, Francisco Javier and Baylac, Maud and Rey, Solenne and Rosetto, Olivier and Villa, Francesca (2014) Evidence of the robustness of a COTS soft-error free SRAM to neutron radiation. IEEE transactions on nuclear science, 61 (6). pp. 3103-3108. ISSN 0018-9499

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6940331&tag=1


Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell design combining SRAM cells and DRAM capacitors to determine if, as claimed, it is soft-error free and to estimate upper bounds for the cross-section. These tests led to cross-section values two orders of magnitude below those of typical CMOS SRAMs in the same technology node. MUSCA SEP3 simulations complement these results predicting that only high-energy neutrons ( > 30 MeV) can provoke bit flips in the studied SRAMs. MUSCA SEP3 is also used to investigate the sensitivity of the studied SRAM to radioactive contamination and to compare it with the one of standard CMOS SRAMs. Results are useful to make predictions about the operation of this memory in environments such as avionics.

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Uncontrolled Keywords:CMOS integrated circuits; DRAM chips; SRAM chips; Capacitors; Contamination; Neutron effects; Radiation hardening (electronics); CMOS SRAM ; COTS soft-error free SRAM; DRAM capacitors; MUSCA SEP3 simulations; SRAM cells; Cross-section values; Electron volt energy 15 MeV; High-energy neutrons; Memory cell design; Neutron radiation; Radiation tests; Radioactive contamination; CMOS integrated circuits; Error analysis; Neutrons;Reliability; SRAM cells; Single event upsets; COTS; LPSRAM; MUSCA SEP3; SRAM; Neutron tests; Radiation hardness; Reliability; Soft error
Subjects:Sciences > Physics > Electronics
Sciences > Computer science > Integrated circuits
ID Code:28876
Deposited On:03 Mar 2015 08:59
Last Modified:10 Dec 2018 14:57

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