The Selection of a radiation-tolerant DAC for the LHC (Part II: CMOS technology)



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Franco Peláez, Francisco Javier and Lozano Rogado, Jesús and Agapito Serrano, Juan Andrés (2003) The Selection of a radiation-tolerant DAC for the LHC (Part II: CMOS technology). In 4ª Conferencia de Dispositivos Electrónicos, CDE 2003 [Recurso electrónico] : Calella de la Costa, Barcelona, 12 a 14 de febrero de 2003: libro de comunicaciones. Instituto de Microelectrónica de Barcelona CNM-CSIC, Bellaterra, V-15. ISBN 84-607-6770-1

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Total dose & neutron tests on commercial CMOS digital-to-analog converters have been carried out. These results are related to those ones presented in the previous paper. This kind of devices is much more sensitive to ionizing radiation than to neutrons. That radiation changes the value of the MOSFET threshold voltage and this can put digital circuits out of action. In this case, the gradual destruction of the digital inputs was observed as a diminution of the output voltage levels. Also, the gamma radiation generates leakage currents that increase the consumption. Due to these converters tolerated less total radiation dose, their use in the LHC has been refused and the fast bipolar technology converters will be employed.

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Item Type:Book Section
Additional Information:

Conferencia de Dispositivos Electrónicos (CDE 2003) (4. 2003. Calella de la Costa, España).
Spanish Conference on Electron Devices.

Uncontrolled Keywords:COTS, Digital-to-analog converters, Radiation tolerance, CMOS technology, LHC.
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
ID Code:29034
Deposited On:20 Mar 2015 18:54
Last Modified:10 Dec 2018 14:58

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