Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons



Downloads per month over past year

Ramos, Pablo and Vargas, Vanessa and Baylac, Maud and Villa, Francesca and Rey, Solenne and Clemente Barreira, Juan Antonio and Zergainoh, Nacer-Eddine and Méhaut, Jean-François and Velazco, Raoul (2016) Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2193-2200. ISSN 0018-9499 (In Press)

[thumbnail of Ramos_et_all_Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons.pdf]

Official URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=23


The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented ECC and parity in their cache memories. Two different application scenarios are studied. The first one configures the multi-core in Asymmetric Multi-Processing mode running a memory-bound application, whereas the second one uses the Symmetric Multi-Processsing mode running a CPU-bound application. The experiments were validated through radiation ground testing performed with 14 MeV neutrons on the Freescale P2041 multi-core manufactured in 45nm SOI technology. A deep analysis of the observed errors in cache memories was carried-out in order to reveal vulnerabilities in the cache protection mechanisms. Critical zones like tag addresses were affected during the experiments. In addition, the results show that the sensitivity strongly depends on the application and the multi-processsing mode used.

Item Type:Article
Additional Information:

“© © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.”

Uncontrolled Keywords:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, Soft Error, SOI, SMP
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Nuclear physics
Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
Sciences > Computer science > Hardware
ID Code:36066
Deposited On:28 Feb 2018 11:47
Last Modified:28 May 2020 07:05

Origin of downloads

Repository Staff Only: item control page