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Liu, Yaohua and Tornos, J. and te Velthuis, S. G. E. and Freeland, J. W. and Zhou, H. and Steadman, P. and Bencok, P. and León Yebra, Carlos and Santamaría Sánchez-Barriga, Jacobo (2016) Induced Ti magnetization at La_(0.7)Sr_(0.3)MnO_(3) and BaTiO_(3) interfaces. APL Materials, 4 (4). ISSN 2166-532X
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Official URL: http://dx.doi.org/10.1063/1.4946756
Abstract
In artificial multiferroics hybrids consisting of ferromagnetic La_(0.7)Sr_(0.3)MnO_(3) (LSMO) and ferroelectric BaTiO_(3) epitaxial layers, net Ti moments are found from polarized resonant soft x-ray reflectivity and absorption. The Ti dichroic reflectivity follows the Mn signal during the magnetization reversal, indicating exchange coupling between the Ti and Mn ions. However, the Ti dichroic reflectivity shows stronger temperature dependence than the Mn dichroic signal. Besides a reduced ferromagnetic exchange coupling in the interfacial LSMO layer, this may also be attributed to a weak Ti-Mn exchange coupling that is insufficient to overcome the thermal energy at elevated temperatures.
Item Type: | Article |
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Additional Information: | © 2016 Author(s). We thank J. Pearson for assistance with SQUID magnetometry study. Work at ORNL is supported by the Division of Scientific User Facilities of the Office of Basic Energy Sciences (BES), US Department of Energy (DOE). Work at MSD, ANL was supported by the U.S. DOE, Office of Science, BES, Materials Sciences and Engineering Division. Research at UCM was supported by Spanish MICINN through Grant Nos. MAT2014-52405-C02-01 and Consolider Ingenio 2010-CSD2009-00013 (Imagine), by CAM through Grant No. S2014/MAT-PHAMA II. This research used resources of the Advanced Photon Source, a U.S. DOE Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. We also thank Diamond Light Source for access to beamline I10. |
Uncontrolled Keywords: | Oxide heterostructures; Tunnel-junctions. |
Subjects: | Sciences > Physics > Electricity Sciences > Physics > Electronics |
ID Code: | 38446 |
Deposited On: | 11 Jul 2016 08:16 |
Last Modified: | 10 Dec 2018 14:57 |
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