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Serrano, A. and Monton, C. and Valmianski, I. and Gálvez Alonso, Fernando and Cortajarena, Aitziber L. and De la Venta, J. and Schuller, Ivan K. and García, M. A. (2014) Study of Co-phthalocyanine films by surface plasmon resonance spectroscopy. Journal of applied physics, 115 (10). ISSN 0021-8979
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Official URL: http://dx.doi.org/10.1063/1.4868160
Abstract
We present a Surface Plasmon Resonance spectroscopy study of Co-Phthalocyanine (CoPc) thin films grown on Au layers at different substrate temperatures. We demonstrate that for quantitative analysis, fitting of the resonance angle alone is insufficient and Whole Curve Analysis (WCA) needs to be performed. This is because CoPc thin film dielectric constant and thickness are strongly affected by substrate temperature, even when the total deposited mass remains fixed. Using WCA, we are able to uniquely fit both the dielectric constants and the thicknesses of the films without making a priori assumptions.
Item Type: | Article |
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Additional Information: | © 2014 AIP Publishing LLC. |
Uncontrolled Keywords: | Thin-films; Cobalt Phthalocyanine; Copper phthalocyanine; Gold; Interfaces; Absorption; Roughness; Sensors |
Subjects: | Sciences > Physics > Materials Sciences > Physics > Solid state physics |
ID Code: | 42937 |
Deposited On: | 26 May 2017 18:38 |
Last Modified: | 04 Jul 2018 17:44 |
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