Publication: Study of Co-phthalocyanine films by surface plasmon resonance spectroscopy
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2014-03-14
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American Institute of Physics
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Abstract
We present a Surface Plasmon Resonance spectroscopy study of Co-Phthalocyanine (CoPc) thin films grown on Au layers at different substrate temperatures. We demonstrate that for quantitative analysis, fitting of the resonance angle alone is insufficient and Whole Curve Analysis (WCA) needs to be performed. This is because CoPc thin film dielectric constant and thickness are strongly affected by substrate temperature, even when the total deposited mass remains fixed. Using WCA, we are able to uniquely fit both the dielectric constants and the thicknesses of the films without making a priori assumptions.
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© 2014 AIP Publishing LLC.
Alberto Gil and Carlos Alonso are acknowledged for technical help with the experimental setup. This work has been supported by the Spanish Ministerio de Ciencia e Innovacion (MICINN) through the projects Nos. FIS-2008-06249, BIO2012- 34835 and MAT2009-14578-C03-02, Comunidad de Madrid, project NANOBIOMAGNET (S2009/MAT-1726). C.M., I.V., and I.K.S. acknowledge support from the Office of Basic Energy Sciences, U.S. Department of Energy, under Grant No. DE FG03-87ER- 45332. A.L.C. acknowledges the European Commission International Reintegration Grant (IRG-246688) and Marie Curie COFUND “AMAROUT-Europe” Programme for fi- nancial support. A.S. thanks the CSIC for JAE-Predoctoral fellowship.