Publication: Desarrollo de una herramienta para discernir errores simples en memorias SRAM sometidas a radiación
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2017
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Abstract
Para testear la vulnerabilidad de las memorias en entornos radiactivos se utilizan fuentes de radiación que en un breve lapso de tiempo, permiten obtener grandes cantidades de errores. Durante estos tests, se mezclan los errores simples (una partícula afecta a una celda de memoria) con los múltiples (una partícula afecta a múltiples celdas de memoria), y no es en absoluto trivial discernir ambos tipos de errores. Sin embargo, para mejorar la precisión de las métricas que evalúan la sensibilidad es imprescindible saber qué errores son simples y cuáles son múltiples.
En este trabajo, nos familiarizaremos con las distintas técnicas para distinguir los tipos de errores mencionados anteriormente. Después crearemos un software con las técnicas necesarias para la prediccion de dichos fallos usando el lenguaje C. Y finalmente desarrollamos una interfaz gráfica que será sencilla e intutitiva para facilitar la obtención de los datos y una mejora en la visualización.
To test the vulnerability of memories in radioactive environments, radiation sources are used to obtain large amounts of errors. During these tests, simple errors (a particle affects a memory cell) are mixed with the multiples (one particle affects multiple memory cells), and it is not at all trivial to discern both types of errors. However, to improve the accuracy of the metrics that evaluate the sensitivity it is imperative to know which errors are simple and which are multiple. In this project, we will familiarize ourselves with the different techniques to tell apart the types of errors mentioned above. Then we will create a software with the necessary techniques for the prediction of such failures using the C language. And finally we developed a graphical interface that will be simple and intuitive to facilitate the obtaining of the data and an improvement in the visualization.
To test the vulnerability of memories in radioactive environments, radiation sources are used to obtain large amounts of errors. During these tests, simple errors (a particle affects a memory cell) are mixed with the multiples (one particle affects multiple memory cells), and it is not at all trivial to discern both types of errors. However, to improve the accuracy of the metrics that evaluate the sensitivity it is imperative to know which errors are simple and which are multiple. In this project, we will familiarize ourselves with the different techniques to tell apart the types of errors mentioned above. Then we will create a software with the necessary techniques for the prediction of such failures using the C language. And finally we developed a graphical interface that will be simple and intuitive to facilitate the obtaining of the data and an improvement in the visualization.
Description
Trabajo de Fin de Grado en Ingeniería de Computadores (Universidad Complutense, Facultad de Informática, curso 2016/2017)