Publication: Out of plane component of the magnetization of sputtered Fe_72Ga_28 layers
Loading...
Official URL
Full text at PDC
Publication Date
2020-11-15
Advisors (or tutors)
Editors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Citations
Exportar
Abstract
In this paper we present an investigation about the out of plane component of the magnetization of Ga-rich sputtered FeGa thin films. To study this magnetic component, we have used magnetometric measurements and magnetic force microscopy combined with a structural characterization by means of x-ray diffractometry. For a more profound analysis, we have examined samples in both, as-grown and annealed state. The out of plane component of the magnetization promotes a magnetic ripple observed by magnetic force microscopy in all the studied samples. To quantitatively monitor the out of plane component of the magnetization, we have used the ratio between the magnetic remanence and the maximum magnetization (M-r/Mmax), i.e. the squareness, measured in the perpendicular hysteresis loops. The experimental results indicate that the out of plane component of the magnetization is reduced upon annealing at a moderate temperature of 400 degrees C. The experimental results can be understood considering that phase coexistence is the most likely origin for the observed magnetic ripple.
Description
©2020 Elsevier
We thank `CAI Difraccion de rayos-X' of UCM for XRD measurements and Instituto of Sistemas Optoelectronicos y Microtecnologia (ISOM) for using some of its facilities. This work has been financially supported through the projects MAT2015-66888-C3-3-R (MINECO/FEDER) of the Spanish Ministry of Economy and Competitiveness, and RTI2018-097895-B-C43 of the Spanish Ministry of Science, Innovation, and Universities.