Universidad Complutense de Madrid
E-Prints Complutense

Strain modulation of Si vacancy emission from SIC micro- and nanoparticles

Downloads

Downloads per month over past year

63567

Impacto

Downloads

Downloads per month over past year

Vásquez Villanueva, Geraldo Cristian and Bathen, M.E. and Galeckas, A. and Bazioti, C. and Johansen, K. M and Maestre Varea, David and Cremades Rodríguez, Ana Isabel and Prytz, O. and Moe, A.M. and Kuznetsov, A. Yu and otros, ... (2020) Strain modulation of Si vacancy emission from SIC micro- and nanoparticles. Nano letters, 20 (12). pp. 8689-8695. ISSN 1530-6984

[thumbnail of MaestreD 12 LIBRE+CC.pdf] PDF
Creative Commons Attribution.

3MB

Official URL: http://dx.doi.org/10.1021/acs.nanolett.0c03472




Abstract

Single-photon emitting point defects in semiconductors have emerged as strong candidates for future quantum technology devices. In the present work, we exploit crystalline particles to investigate relevant defect localizations, emission shifting, and waveguiding. Specifically, emission from 6H-SiC micro- and nanoparticles ranging from 100 nm to 5 mu m in size is collected using cathodoluminescence (CL), and we monitor signals attributed to the Si vacancy (V_Si) as a function of its location. Clear shifts in the emission wavelength are found for emitters localized in the particle center and at the edges. By comparing spatial CL maps with strain analysis carried out in transmission electron microscopy, we attribute the emission shifts to compressive strain of 2-3% along the particle a-direction. Thus, embedding V_Si, qubit defects within SiC nanoparticles offers an interesting and versatile opportunity to tune single-photon emission energies while simultaneously ensuring ease of addressability via a self-assembled SiC nanoparticle matrix.


Item Type:Article
Additional Information:

© 2020 American Chemical Society.
Artículo firmado por más de diez autores.
Financial support was kindly provided by the Research Council of Norway and the University of Oslo through the frontier research project FUNDAMeNT (no. 251131, FriPro ToppForsk-program). The Research Council of Norway is acknowledged for the support to the Norwegian Micro-and Nano-Fabrication Facility, NorFab, project number 245963, and the Norwegian Center for Transmission Electron Microscopy (NORTEM) (no. 197405/F50). D.M. and A.C. thank the MINECO/FEDER/M-ERA.Net Cofund projects RTI2018-097195-B-I00 and PCIN-2017-106

Uncontrolled Keywords:Raman-scattering; Silicon vacancy; Color centers; SiC; cathodoluminescence; micro- and nanoparticles; strain tuning
Subjects:Sciences > Physics > Materials
Sciences > Physics > Solid state physics
ID Code:63567
Deposited On:19 Jan 2021 17:31
Last Modified:20 Jan 2021 08:13

Origin of downloads

Repository Staff Only: item control page