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Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories



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Korkian, Golnaz and León González, Daniel and Franco Peláez, Francisco Javier and Fabero Jiménez, Juan Carlos and Letiche, Manon and Morilla, Yolanda and Martín Holgado, Pedro and Puchner, Helmut and Mecha López, Hortensia and Clemente Barreira, Juan Antonio (2022) Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories. IEEE access, 10 . pp. 114566-114585. ISSN 2169-3536

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Official URL: http://dx.doi.org/10.1109/ACCESS.2022.3217527


In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) memories and emerging technology devices. This paper investigates the behavior of state-of-the-art memories manufactured in emerging technologies, including Ferroelectric Random-Access Memory (FRAM), Resistive Random-Access Memory (ReRAM), and Magnetic Random-Access Memory (MRAM), against radiation effects in static and dynamic modes. Radiation-ground tests were conducted under 15-MeV and 1-MeV protons, thermal and 14.8-MeV neutrons leading to various categories of radiation effects. Experimental results will show clear evidence of the robustness of bitcells manufactured using these emerging technologies against radiation, but at the same time, some susceptibility in these devices to suffer radiation effects when working in dynamic mode. Experimental results with the CY15B102Q and CY15B104Q FRAMs (Infineon Technologies), the MB85AS4MT, and MB85AS8MT ReRAMs (Fujitsu), and the MR10Q010CSC and MR25H40CDF MRAMs (Everspin) will be presented and discussed.

Item Type:Article
Additional Information:

This work was supported in part by the Spanish MINECO projects under Grant TIN2017-87237-P and Grant PID2020-112916GB-I00, and in part by the European Union's Horizon 2020 Research and Innovation Program under Grant 101008126.

Uncontrolled Keywords:Radiation
Subjects:Sciences > Physics > Electricity
Sciences > Physics > Electronics
ID Code:76492
Deposited On:06 Feb 2023 09:13
Last Modified:06 Feb 2023 09:13

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