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Schmidt, Rainer and Mayrhofer, Patrick and Schmid, Ulrich and Bittner, Achim (2019) Impedance spectroscopy of Al/AlN/n-Si metal-insulator-semiconductor (MIS) structures. Journal of applied physics, 125 (8). ISSN 0021-8979

This list was generated on Thu Jan 27 02:51:54 2022 CET.