Universidad Complutense de Madrid
E-Prints Complutense


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Martínez Antón, Juan Carlos and Siegmann, Philip and Sánchez Brea, Luis Miguel and Gómez Pedrero, José Antonio and Canabal Boutureira, Héctor and Bernabeu Martínez, Eusebio (2001) In-line detection and evaluation of surface defects on thin metallic wires. In Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering. Proceedings of The Society Of Photo-Optical Instrumentation Engineers (SPIE) (4399). The International Society for Optical Engineering (SPIE), pp. 27-34. ISBN 0-8194-4094-9

This list was generated on Thu Apr 22 03:36:22 2021 CEST.