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González Díaz, Germán and Artús, L. and Blanco, N. and Cuscó, R. and Ibáñez, J. and Long, A.R. and Rahman, M. (2000) Comparison of Raman-scattering and Shubnikov-de Haas measurements to determine charge density in doped semiconductors. Journal of Applied Physics, 88 (11). pp. 6567-6570. ISSN 0021-8979

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